Aaqil

PhD Research Associate

Automated Wheat Leaf Disease Detection Using Deep Learning with TensorFlow and Keras


Conference paper


P Kumar, S Senthil Pandi, Mithun Dineshkumar, Muqaddam Aaqil Sheriff
2024 International Conference on Recent Advances in Science and Engineering Technology (ICRASET), 2024, pp. 1-6


Cite

Cite

APA   Click to copy
Kumar, P., Senthil Pandi, S., Dineshkumar, M., & Sheriff, M. A. (2024). Automated Wheat Leaf Disease Detection Using Deep Learning with TensorFlow and Keras. In 2024 International Conference on Recent Advances in Science and Engineering Technology (ICRASET) (pp. 1–6). https://doi.org/10.1109/ICRASET63057.2024.10895184


Chicago/Turabian   Click to copy
Kumar, P, S Senthil Pandi, Mithun Dineshkumar, and Muqaddam Aaqil Sheriff. “Automated Wheat Leaf Disease Detection Using Deep Learning with TensorFlow and Keras.” In 2024 International Conference on Recent Advances in Science and Engineering Technology (ICRASET), 1–6, 2024.


MLA   Click to copy
Kumar, P., et al. “Automated Wheat Leaf Disease Detection Using Deep Learning with TensorFlow and Keras.” 2024 International Conference on Recent Advances in Science and Engineering Technology (ICRASET), 2024, pp. 1–6, doi:10.1109/ICRASET63057.2024.10895184.


BibTeX   Click to copy

@inproceedings{kumar2024a,
  title = {Automated Wheat Leaf Disease Detection Using Deep Learning with TensorFlow and Keras},
  year = {2024},
  pages = {1-6},
  doi = {10.1109/ICRASET63057.2024.10895184},
  author = {Kumar, P and Senthil Pandi, S and Dineshkumar, Mithun and Sheriff, Muqaddam Aaqil},
  booktitle = {2024 International Conference on Recent Advances in Science and Engineering Technology (ICRASET)}
}